v oltage to frequency converter AD537S asd0016511 rev. d information furnished by analog devices is believed to be accurate and reliable. however, no responsibility is assumed by analog devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. specifications subject to change without notice. no license is granted by implication or otherwise under any patent or patent rights of analog devices. trademarks and registered trademarks are the property of their respective companies. one technology way, p.o. box 9106, norwood, ma 02062-9106, u.s.a. tel: 781.329.4700 www.analog.com fax: 781.326.8703 ? 2010 analog devices, inc. all rights reserved. 1.0 scope this specification documents the detail requirements for space qualified product manufactured on analog devices, inc.'s qml certified line per mil-prf-38535 level v except as modified herein. the manufacturing flow described in the standard space level products program brochure is to be considered a part of this specification. http://www.analog.com/aerospace this data sheet specifically details the space grade version of this product. a more detailed operational description and a complete data sheet for commercial product grades can be found at www.analog.com/ad537 2.0 part number . the complete part number(s) of this specification follow: part number description ad537-703d voltage to frequency converter with 0 to 150khz frequency range 3.0 case outline letter descriptive designator case outline (lead finish per mil-prf-38535) d cdip2-t14 14-lead side-brazed ceramic dual-in-line package figure 1 - terminal connections
AD537S asd0016511 rev. d | page 2 of 5 4.0 absolute maximum ratings. (t a = 25c, unless otherwise noted) voltage, rated performance single suppl y .................................................. 4.5 to 36v voltage, rated performance du al supply ................................................ 5 v to 18v operating temperature range ............................................................ -55 c to +125c storage temperature ra nge ................................................................ - 65c to +150c lead temperature (sol dering, 10 s ec.) ............................................................. +300c maximum junction temperature (t j ) ............................................................... +150c notes: stresses above those listed under absolute maximum ratings may c ause permanent damage to the device. this is a stress rating on ly; functional operation of the device at these or other conditions above thos e indicated in the operation sections of this specifi cation is not implied. exposure to absolute ma ximum ratings for extended periods may affect device reliability. 5.0 thermal characteristics: package type junction-to-case ( jc ) junction-to-ambient ( ja ) units thermal resistance, 14 dip (x) 25 95 c/w max
AD537S asd0016511 rev. d | page 3 of 5 6.0 table i. electrical table : table i parameter see notes at end of table symbol conditions note 1/ sub- group limit min limit max units frequency range f o 1 0 150 khz linearity error (nonlinearity) le f o = 10khz 1 0.07 % f o = 100khz 4 0.1 gain error (full-scale calibration error) a e c=0.01uf, iin=1.00ma 1 -5 5 % gain vs. supply a e / vs f o = 10khz, 15v AD537S asd0016511 rev. d | page 4 of 5 7.0 table ii. electrical test requirements : table ii test requirements subgroups (in accordance with mil-prf-38535, table iii) interim electrical parameters 1 final electrical parameters 1, 2, 3, 4 1 / 2 / group a test requirements 1, 2, 3, 4 group c end-point electrical parameters 1 2 / group d end-point electrical parameters 1 group e end-point electrical parameters n/a notes: 1/ pda applies to subgroup 1. delta?s excluded from pda. 2/ see table iii for delta limits. see table i for test conditions. 8.0 table iii. life test / burn-in delta limits: table iii test symbol delta limit units i s 0.3 ma v os 1 mv 9.0 life test / burn-in circuit: 9.1 htrb is not applicable for this drawing. 9.2 burn-in is per mil-std-883 method 1015, test condition b. 9.3 steady state life test is per mil-std-883 method 1005, test condition b. 10. 0 mil-std-38535 qmlv exceptions: 10.1 full wla per mil-std-883 tm 5007 is not available for this product. sem inspection only is available per mil-std-883, tm2018.
AD537S asd0016511 rev. d | page 5 of 5 rev description of change date a initiate july 17, 2007 b update header/footer and add to 1.0 scope description. march 6, 2008 c add junction temperature (t j )?...+150c to absolute max. ratings april 2, 2008 d remove post group c specificat ion limits in table iii such that only delta limits are listed. correct case outline letter and descriptive designator. formatting improvements. march 25, 2010 ? 2010 analog devices, inc. all rights reserved. trademarks and registered trademarks are the property of their respective companies. printed in the u.s.a. 3/10
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